11

Abstracts. No. 11, 2017 year
 
ABSTRACTS
Prilepko M.Yu., Lysenko V.G. (e-mail: prilepko@vniims.ru)

Piezoelectric transducers of dynamic force. Definition of metrological characteristics. Uncertainty of calibration

In article the relevance of measurements of dynamic force in diagnostics of a condition of machines and mechanisms is considered, the principles of calibration and methods of definition of metrological characteristics of the piezoelectric dynamic force transducers are shown. The purpose of work is the analysis of the known methods of calibration for definition of their restrictions and justification of the new method of calibration providing definition of metrological characteristics of dynamic force transducers by criteria of service conditions and establishments of a possibility of they use taking into account their alleged appointment. The following tasks are solved: the integrated transfer characteristic and mathematical model of a new method of calibration, the main equations of measurements of the known method of calibration of dynamic force transducers by means of the load weight and a deformation method is constructed, the comparative budget of uncertainty of calibration of both methods is made, the main components of the budget of uncertainty of calibration are shown. It is shown that use of a method of calibration by means of measurements by the laser interferometer of deformations of the reference force- deformation converter on the basis of the elastic calibrated element allows to exclude a considerable part of the components of the budget of uncertainty inherent in a method of load weight.

Keywords: the calibrated elastic element, the laser interferometer, mathematical model, the main equation of measurements, the piezoelectric transducer of dynamic forces, components of the budget of uncertainty.

Chukareva M.M., Badeeva E.A., Motin A.V., Slavkin I.E., Murashkina T.I., Istomina T.V., Istomin V.V. (e-mail: timurashkina@mail.ru)

Justification of the possibility of the amplitude-phase transformation of signals in fiber-optica pressure sensors

This article assesses the possibility of using the amplitude-phase conversion of signals in fiber optic pressure sensors (FOPS). Offers a new optoelectronic fiber pressure sensor (OEFPS) with compensation channel, combining the advantages of fiber-optic sensors and optoelectronic sensors. The proposed structural diagram of OEFPS for explaining the principle of its work. The rationale for the selection of the design parameters that provide improvement of metrological characteristics of OEFPS. Discusses ways to reduce the linearity error and temperature error of OEFPS.

Keywords: fiber optoelectronic pressure sensor, the amplitude-phase conversion, channel compensation, the receiver of the radiation, a scaling circuit, conversion function, linearization.

Pluzhnova T.S. (e-mail: pluzhnova_t@sm1820.ru)

Application of the BEREMIZ CAD system for microcontrollers MILANDR series K1986BE1QI

The paper discusses the use of the Beremiz CAD runtime on the K1986BE1QI Miland microcontrollers. The description of the components of the CAD system Beremiz is considered. The algorithm of the PLC operation in the Beremiz CAD runtime environment is described. Based on the conducted research, it is proposed to allocate an isolated area of memory for user programs. The way to create an additional memory area is shown. To update the program on the microcontroller, the RS-485 interface is used, which makes it possible to transmit data for distances up to 2 km. Taking into account the peculiarities of rewriting programs for microcontrollers Miland, a new user function is introduced for the Modbus-RTU protocol, used for data transmission through RS-485 serial communication lines. The structure and description of the package for software updates on microcontrollers is given. The algorithm for downloading the software of the microcontroller is described with subsequent verification of the recorded data.

Keywords: microcontroller programming, BEREMIZ CAD, technological algorithms, IEC 61131-3 languages.

Levenets A.V., Chye En Un (e-mail: chye@ais.khstu.ru)

Hardware for support of the periodic component detection algorithm based on zero-crossing

The article proposes an algorithm for detecting a periodic component in a measurement signal, based on the calculation of the signal's zero-crossing numbers. The algorithm can be used to indicate of the progressing of resonant phenomena, to determine the presence of a carrier signal, and so on. The structures of the basic modules required for constructing hardware support devices of the proposed algorithm are proposed. The proposed modules are relatively easy to implement and can be easily manufactured for example using FPGA technology.

Keywords: smeasurement data, zero-crossing, periodic component of signal, quasispectrum, hardware.

Levenets A.V., Chye En Un (e-mail: chye@ais.khstu.ru)

Compression of measuring data based on the geometric approach to their representation

In paper the geometry representation of measurement data is proposed. This approach allows us to consider a set of measurement data samples from different sources as a single information object. This makes it possible to identify and take into account, through preprocessing, implicit correlation dependencies in the original data. The structure of the compression device that implements the proposed approach is described. The results of the study of the proposed approach on telemechanical data are presented.

Keywords: measurement data, preprocessing, lossless compression, data compression device.

Aslanyan A. (e-mail: andrey_aslanyan@vniiftri.ru)

Traceability of hardness measurements of thin coatings to the national primary standard machines

The article describes the procedure of traceability hardness measurements by instrumented indentation in micro - and nano - ranges and the method of Vickers in microrange. Describes the hierarchy scheme for measuring instruments of hardness by instrumented indentation methods and the Vickers method.

Keywords: hardness of coatings, primary standard machine, Martens scales, indentation scales, nanoindentation.

Pautkin V.E. (e-mail: inercial@niifi.ru)

Methods for controlling the geometric dimensions of micromechanical structures during anisotropic etching of silicon

Parameters of micromechanical sensors, such as silicon accelerometers, angular velocity sensors, etc., depend on the geometry of the springy elements being formed. When manufacturing micromechanical sensors, it is necessary to accurately control the thickness of the microstructures formed. Methods for controlling the geometric dimensions of the springy elements of micromechanical sensors during anisotropic etching of silicon are described. Among these methods include control over the etching time, a direct control method, a method of control undercut, control based on the effect of stop-etching. The latter is based on the anisotropic properties of single-crystal silicon and is characterized by simplicity and manufacturability, which makes it possible to use it in the formation of silicon springy elements.

Keywords: anisotropic etching of silicon, elastic element, test structure, crystallographic planes, micromechanical sensor.

Torgashin S.I., Pautkin V. E, Kraynova K.Y. (e-mail: niifi@sura.ru)

The constructive-technological decisions defining geometry of formed micromechanical structures at anisotropic etching of silicon

Perfection of technology of anisotropic deep etching of silicon actually at formation of the set geometrical sizes of received structures to within 1 nanometer. Micromechanical accelerometres and angular-rate sensors incorporate the structural members representing open mesa structures on a silicon plate, with external angles, thereby an article main objective search is constructive-technological the solutions promoting reproducibility of parametres of given mesa structures is. The main problems arising at anisotropic etching of elements in silicon with external angles owing to what experimental researches on elimination of the existing problems influencing quality of formed structure are conducted are considered and analysed. The basic constructive and technological solutions promoting elimination excessive etching of external angles and decrease of a roughness of a surface at deep etching are experimentally revealed. The is constructive-technological solutions determining geometry of formed silicon structures at etching in a water solution potassium hydroxide KOH of are considered. Addition in external angles of microstructures of compensatory elements, allows to receive almost ideal right angle at deep anisotropic etching of silicon. The technological solutions directed on preservation of quality of an etched surface, allow to lower a roughness of a formed surface in comparison with a pure solution. Preliminary chemical processing of a surface directly ahead of anisotropic etching also allows to improve quality of an etched surface of silicon.

Keywords: the accelerometre, a silicon plate, anisotropic etching, excessive etching of the external angles, compensatory elements, a roughness, a solution potassium hydroxide.

Klyuev V.V., Matveev V.I., Artemiev B.V. (e-mail: boris@artemiev.su)

The exhibition Testing & Control and the exhibition NDT Russia

The article gives a brief description of instruments and equipment presented at the largest thematic event in Russia, combining two related exhibitions Testing & Control and the 17th International Exhibition NDT Russia. The CROCUS exhibition complex provided an opportunity for manufacturers and suppliers from Russia and other countries to demonstrate their developments in the field of testing equipment, non-destructive testing, analytical chemistry and laboratory research. The exhibition presented all the necessary elements for the integrated equipment of laboratories from design, climate, gas, water, air preparation to the selection of analytical equipment, laboratory furniture, glassware, laboratory automation equipment, chemical reagents, reference materials and consumables. The latest equipment for all major methods of NDT and TD.

Keywords: non-destructive testing, analytical equipment, testing equipment, safety, technical diagnostics, microscopy, spectroscopy, laboratory equipment.