Abstracts. 1, 2017 year
Gamkrelidze S.A., Kondratenko V.S., Styran V.V., Trofimov A.A., Shchavruk N.V. (e-mail: vsk1950@mail.ru)

Influence of sapphire and silicon carbide wafers cutting methods on technical and operational parameters monolithic integrated circuits

This paper is about the development and optimization of technological routes, increasing the efficiency of existing cutting methods of wafers with microwave monolithic integrated circuit (MMIC) on crystals-dicing by saw with diamond cutting edge and laser-controlled thermosplitting (LCTS). The results of experimental studies of the effect of cutting of sapphire and silicon carbide wafers by the developed technological routes on the parameters of the MMIC.

Keywords: lasercontrolled thermal splitting (LCTS), microwave monolithic integrated circuit (MMIC), sapphire, silicon carbide.

Kluyev V.V., Mtveev V.I., Artemiev B.V. (e-mail: boris@artemiev.su)


Surveillance and analytical article presents a summary of Chemistry 2016 exhibition, which was held in the exhibition complex Expocentre from 19 to 22 September 2016 in Moscow (Russia). The exposition has been presented many kinds of high-tech equipment, spectrometers and analytical technologies based on them. Hardware overview presented at the stands of the participants carried out by functional groups. Business program consisted of several well-known companies and workshops took place simultaneously with the exhibition.

Keywords: X-ray spectrometer, FTIR spectrometer, flow and level meters, non-destructive testing.